Design for Test and Reliability in Ultimate CMOS
type: Dataset
contact point: Organization
  fn: CCSD
keyword: spinanoengineering-sciences-physicsmicro-and-nanotechnologiesmicroelectronics
keyword: pacs-8542
keyword: design-for-yield
keyword: infoeu-reposemanticsconferenceobject
keyword: design-for-test-dft
keyword: cmos
keyword: conference-papers
landing page: Proc. of Design, Automation and Test in Europe (DATE'12)
description: ISBN 978-3-9810801-8-6
issued: 2026-05-21T18:49:51.155316
language: en
modified: 2026-05-21T18:49:51.155320

Design for Test and Reliability in Ultimate CMOS
type: Distribution
access URL: https://hal.science/hal-00688282
format: HTML
issued: 2026-05-21T18:49:51.169217
modified: 2026-05-21T18:49:51.141950

test_moissonnage_selune
type: Agent