Smart sampling for risk reduction and delay optimisation
type: Dataset
description: International audience
landing page: 2012 IEEE International Systems Conference
keyword: conference-papers
keyword: control-plan
keyword: infoeu-reposemanticsconferenceobject
keyword: smart-sampling
keyword: spiautoengineering-sciences-physicsautomatic
keyword: statistical-study
keyword: time-delay
keyword: wafer-at-risk
issued: 2026-05-22T11:45:32.388092
modified: 2026-05-22T11:45:32.388099
language: en
contact point: Organization
  fn: CCSD

test_moissonnage_selune
type: Agent

Smart sampling for risk reduction and delay optimisation
type: Distribution
format: HTML
access URL: https://hal.science/hal-00685926
issued: 2026-05-22T11:45:32.393431
modified: 2026-05-22T11:45:32.340663