Device for quantitative detection of copper in silicon by transient ionic drift and method using same
type: Dataset
identifier: Patent N°: N° US6504377
issued: 2026-05-22T14:26:32.452864
language: en
modified: 2026-05-22T14:26:32.452870
contact point: Organization
  fn: CCSD
keyword: infoeu-reposemanticspatent
keyword: patents
landing page: https://hal.science/hal-00685601

Device for quantitative detection of copper in silicon by transient ionic drift and method using same
type: Distribution
format: HTML
issued: 2026-05-22T14:26:32.474173
modified: 2026-05-22T14:26:32.441924
access URL: https://hal.science/hal-00685601

test_moissonnage_selune
type: Agent