Device for quantitative detection of copper in silicon by transient ionic drift and method using same
type: Dataset
identifier: Patent N°: N° FR2795822
issued: 2026-05-22T14:27:17.722013
language: en
modified: 2026-05-22T14:27:17.722018
contact point: Organization
  fn: CCSD
keyword: infoeu-reposemanticspatent
keyword: patents
landing page: https://hal.science/hal-00685591

Device for quantitative detection of copper in silicon by transient ionic drift and method using same
type: Distribution
format: HTML
issued: 2026-05-22T14:27:17.730500
modified: 2026-05-22T14:27:17.715526
access URL: https://hal.science/hal-00685591

test_moissonnage_selune
type: Agent