Soft-error-rate prediction for programmable circuits: methodology, tools and studied cases
type: Dataset
description: International audience
keyword: circuits
keyword: conference-papers
keyword: infoeu-reposemanticsconferenceobject
keyword: pacs-8542
keyword: soft-error-rates
keyword: spinanoengineering-sciences-physicsmicro-and-nanotechnologiesmicroelectronics
issued: 2026-05-26T18:00:53.268461
modified: 2026-05-26T18:00:53.268467
language: en
contact point: Organization
  fn: CCSD

test_moissonnage_selune
type: Agent

Soft-error-rate prediction for programmable circuits: methodology, tools and studied cases
type: Distribution
format: HTML
access URL: https://hal.science/hal-00674531
issued: 2026-05-26T18:00:53.273335
modified: 2026-05-26T18:00:53.253660