test_moissonnage_selune
type: Agent

In Flight SEU/MCU Sensitivity of Commercial Nanometric SRAMs: Operational Estimations
type: Dataset
contact point: Organization
  fn: CCSD
keyword: integrated-circuits
keyword: spinanoengineering-sciences-physicsmicro-and-nanotechnologiesmicroelectronics
keyword: journal-articles
keyword: infoeu-reposemanticsarticle
keyword: protons
keyword: sram
keyword: pacs-8542
landing page: 0018-9499
description: International audience
issued: 2026-05-27T18:19:22.166194
language: en
modified: 2026-05-27T18:19:22.166200

In Flight SEU/MCU Sensitivity of Commercial Nanometric SRAMs: Operational Estimations
type: Distribution
access URL: https://hal.science/hal-00672424
format: HTML
issued: 2026-05-27T18:19:22.212879
modified: 2026-05-27T18:19:22.147859