Eliminating speed penalty in ECC protected memories
type: Dataset
description: ISBN 978-1-61284-208-0
issued: 2026-05-28T05:49:35.503517
language: en
modified: 2026-05-28T05:49:35.503522
contact point: Organization
  fn: CCSD
keyword: conference-papers
keyword: error-correcting-code
keyword: infoeu-reposemanticsconferenceobject
keyword: integrated-circuit-reliability
keyword: pacs-8542
keyword: spinanoengineering-sciences-physicsmicro-and-nanotechnologiesmicroelectronics
landing page: Proc. of Design Automation and Test in Europe Conference (DATE'11)

Eliminating speed penalty in ECC protected memories
type: Distribution
format: HTML
issued: 2026-05-28T05:49:35.550003
modified: 2026-05-28T05:49:35.485228
access URL: https://hal.science/hal-00671366

test_moissonnage_selune
type: Agent