@prefix dcat: <http://www.w3.org/ns/dcat#> .
@prefix dct: <http://purl.org/dc/terms/> .
@prefix foaf: <http://xmlns.com/foaf/0.1/> .
@prefix vcard: <http://www.w3.org/2006/vcard/ns#> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

<https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-hal-00669745v1> a dcat:Dataset ;
    dct:description "2 pages" ;
    dct:identifier "hal-00669745" ;
    dct:issued "2026-05-28T20:19:50.502081"^^xsd:dateTime ;
    dct:language "en" ;
    dct:modified "2026-05-28T20:19:50.502086"^^xsd:dateTime ;
    dct:publisher <https://rec.harvest-normandie.data4citizen.com/organization/cce9db95-46d9-4dc2-84b6-764215d0a002> ;
    dct:title "Characterisation of electromagnetic compatibility drifts of nanoscale integrated circuit after accelerated life tests" ;
    dcat:contactPoint [ a vcard:Organization ;
            vcard:fn "CCSD" ] ;
    dcat:distribution <https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-hal-00669745v1/resource/e0dae4ba-3391-4d90-b7c3-78983d849d45> ;
    dcat:keyword "accelerated-lifetime-tests",
        "aging",
        "electromagnetic-compatibility",
        "infoeu-reposemanticsarticle",
        "integrated-circuits",
        "journal-articles",
        "spitronengineering-sciences-physicselectronics" ;
    dcat:landingPage <ISSN:%200013-5194> .

<ISSN:%200013-5194> a foaf:Document .

<https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-hal-00669745v1/resource/e0dae4ba-3391-4d90-b7c3-78983d849d45> a dcat:Distribution ;
    dct:format "HTML" ;
    dct:issued "2026-05-28T20:19:50.504756"^^xsd:dateTime ;
    dct:modified "2026-05-28T20:19:50.485300"^^xsd:dateTime ;
    dct:title "Characterisation of electromagnetic compatibility drifts of nanoscale integrated circuit after accelerated life tests" ;
    dcat:accessURL <https://hal.science/hal-00669745> .

<https://rec.harvest-normandie.data4citizen.com/organization/cce9db95-46d9-4dc2-84b6-764215d0a002> a foaf:Agent ;
    foaf:name "test_moissonnage_selune" .

