@prefix dcat: <http://www.w3.org/ns/dcat#> .
@prefix dct: <http://purl.org/dc/terms/> .
@prefix foaf: <http://xmlns.com/foaf/0.1/> .
@prefix vcard: <http://www.w3.org/2006/vcard/ns#> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

<https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-hal-00097854v1> a dcat:Dataset ;
    dct:description """
              The structural evolutions of a-C:H thin films prepared by r.f. plasma-enhanced chemical vapor deposition from a CH yAr or 4 CH yHe gas mixture have been investigated. Elastic recoil detection analysis, infrared and Raman spectroscopies have been used 4 to quantify, respectively, hydrogen content, the bonding and sp proportion carbon of thin films. The variations of electron spin 2 resonance parameters, the peak-to-peak linewidth DH , g-factor and the spin density, as a function of the film preparation are pp discussed on the basis of the complete physico-chemical characterization. The type of defects do not change drastically when the conditions of the film preparation vary contrary to the spin–spin interaction: a stronger exchange resulting from the greater delocalization of the p-electron occurs when the bias voltage increases. Moreover, the hyperfine interaction of the spins with the hydrogen atoms decreases. We have found that the optical band gap E of these films decreases with the loss of hydrogen g (bonded and unbonded) and the increasing of sp content while E gap increases. These results have been related to the spin densities.
            """ ;
    dct:identifier "hal-00097854" ;
    dct:issued "2026-05-05T14:50:35.472573"^^xsd:dateTime ;
    dct:language "en" ;
    dct:modified "2026-05-05T14:50:35.472577"^^xsd:dateTime ;
    dct:publisher <https://rec.harvest-normandie.data4citizen.com/organization/cce9db95-46d9-4dc2-84b6-764215d0a002> ;
    dct:title "Characterization by electron spin resonance of defects in a-C:H thin films. Correlation between structural evolutions and optical properties" ;
    dcat:contactPoint [ a vcard:Organization ;
            vcard:fn "CCSD" ] ;
    dcat:distribution <https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-hal-00097854v1/resource/6e6863ea-1d78-4cd1-95dd-f495f6b34f66> ;
    dcat:keyword "a-ch-thin-films",
        "disorder",
        "electron-spin-resonance",
        "infoeu-reposemanticsarticle",
        "journal-articles",
        "optical-properties",
        "physcondcm-msphysics-physicscondensed-matter-cond-matmaterials-science-cond-matmtrl-sci",
        "structure" ;
    dcat:landingPage <ISSN:%200257-8972> .

<ISSN:%200257-8972> a foaf:Document .

<https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-hal-00097854v1/resource/6e6863ea-1d78-4cd1-95dd-f495f6b34f66> a dcat:Distribution ;
    dct:format "HTML" ;
    dct:issued "2026-05-05T14:50:35.479052"^^xsd:dateTime ;
    dct:modified "2026-05-05T14:50:35.462053"^^xsd:dateTime ;
    dct:title "Characterization by electron spin resonance of defects in a-C:H thin films. Correlation between structural evolutions and optical properties" ;
    dcat:accessURL <https://hal.science/hal-00097854> .

<https://rec.harvest-normandie.data4citizen.com/organization/cce9db95-46d9-4dc2-84b6-764215d0a002> a foaf:Agent ;
    foaf:name "test_moissonnage_selune" .