Thichkness measurement of non–transparent free films by means of a double–side white–light interferometer
type: Dataset
landing page: 10th International Conference Metrology and properties of Engineering Surfaces
keyword: conference-papers
keyword: infoeu-reposemanticsconferenceobject
issued: 2026-05-06T05:33:02.891489
modified: 2026-05-06T05:33:02.891492
language: en
contact point: Organization
  fn: CCSD

test_moissonnage_selune
type: Agent

Thichkness measurement of non–transparent free films by means of a double–side white–light interferometer
type: Distribution
format: HTML
access URL: https://hal.science/hal-00095257
issued: 2026-05-06T05:33:02.893029
modified: 2026-05-06T05:33:02.887347