From Microelectronics to Integrated Microsystems Testing
type: Dataset
description: International audience
issued: 2026-05-09T13:31:54.881769
language: en
modified: 2026-05-09T13:31:54.881772
contact point: Organization
  fn: CCSD
keyword: cad
keyword: infoeu-reposemanticsarticle
keyword: integrated-circuits
keyword: journal-articles
keyword: mems
keyword: microsystems
keyword: pacs-8542
keyword: self-test
keyword: spinanoengineering-sciences-physicsmicro-and-nanotechnologiesmicroelectronics
keyword: test
landing page: Nano et micro technologies

From Microelectronics to Integrated Microsystems Testing
type: Distribution
format: HTML
issued: 2026-05-09T13:31:54.884068
modified: 2026-05-09T13:31:54.871106
access URL: https://hal.science/hal-00086756

test_moissonnage_selune
type: Agent