@prefix dcat: <http://www.w3.org/ns/dcat#> .
@prefix dct: <http://purl.org/dc/terms/> .
@prefix foaf: <http://xmlns.com/foaf/0.1/> .
@prefix vcard: <http://www.w3.org/2006/vcard/ns#> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

<https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-hal-00086756v1> a dcat:Dataset ;
    dct:description "International audience" ;
    dct:identifier "hal-00086756" ;
    dct:issued "2026-05-09T13:31:54.881769"^^xsd:dateTime ;
    dct:language "en" ;
    dct:modified "2026-05-09T13:31:54.881772"^^xsd:dateTime ;
    dct:publisher <https://rec.harvest-normandie.data4citizen.com/organization/cce9db95-46d9-4dc2-84b6-764215d0a002> ;
    dct:title "From Microelectronics to Integrated Microsystems Testing" ;
    dcat:contactPoint [ a vcard:Organization ;
            vcard:fn "CCSD" ] ;
    dcat:distribution <https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-hal-00086756v1/resource/e4ad5cff-b465-40ae-8a94-87c2a682e60b> ;
    dcat:keyword "cad",
        "infoeu-reposemanticsarticle",
        "integrated-circuits",
        "journal-articles",
        "mems",
        "microsystems",
        "pacs-8542",
        "self-test",
        "spinanoengineering-sciences-physicsmicro-and-nanotechnologiesmicroelectronics",
        "test" ;
    dcat:landingPage <Nano%20et%20micro%20technologies> .

<Nano%20et%20micro%20technologies> a foaf:Document .

<https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-hal-00086756v1/resource/e4ad5cff-b465-40ae-8a94-87c2a682e60b> a dcat:Distribution ;
    dct:format "HTML" ;
    dct:issued "2026-05-09T13:31:54.884068"^^xsd:dateTime ;
    dct:modified "2026-05-09T13:31:54.871106"^^xsd:dateTime ;
    dct:title "From Microelectronics to Integrated Microsystems Testing" ;
    dcat:accessURL <https://hal.science/hal-00086756> .

<https://rec.harvest-normandie.data4citizen.com/organization/cce9db95-46d9-4dc2-84b6-764215d0a002> a foaf:Agent ;
    foaf:name "test_moissonnage_selune" .