Comparative study of the structure of a-CNx and a-CNx:H films using NEXAFS, XPS and FT-IR analysis
type: Dataset
description: EMRS 2004, Symposium J
issued: 2026-05-11T02:27:13.259257
language: en
modified: 2026-05-11T02:27:13.259261
contact point: Organization
  fn: CCSD
keyword: amorphous-carbon
keyword: carbon-nitride
keyword: chimtheochemical-sciencestheoretical-andor-physical-chemistry
keyword: ft-ir
keyword: infoeu-reposemanticsarticle
keyword: journal-articles
keyword: nexafs
keyword: thin-films
keyword: xps
landing page: 0040-6090

Comparative study of the structure of a-CNx and a-CNx:H films using NEXAFS, XPS and FT-IR analysis
type: Distribution
format: HTML
issued: 2026-05-11T02:27:13.261070
modified: 2026-05-11T02:27:13.249178
access URL: https://hal.science/hal-00082385

test_moissonnage_selune
type: Agent