A built-in I/sub IDDQ/ testing circuit
type: Dataset
description: ISBN: 0-7803-9205-1
issued: 2026-05-13T10:25:49.141014
language: en
modified: 2026-05-13T10:25:49.141022
contact point: Organization
  fn: CCSD
keyword: built-in-self-test
keyword: conference-papers
keyword: failure-analysis
keyword: infoeu-reposemanticsconferenceobject
keyword: integrated-circuit-testing
keyword: leakage-currents
keyword: pacs-8542
keyword: spinanoengineering-sciences-physicsmicro-and-nanotechnologiesmicroelectronics
landing page: Solid-State Circuits Conference, 2005. ESSCIRC 2005. Proceedings of the 31st European

A built-in I/sub IDDQ/ testing circuit
type: Distribution
format: HTML
issued: 2026-05-13T10:25:49.186534
modified: 2026-05-13T10:25:49.091708
access URL: https://hal.science/hal-00079771

test_moissonnage_selune
type: Agent