Asynchronous circuits transient faults sensitivity evaluation
type: Dataset
description: ISBN:1-59593-058-2
keyword: asynchronous-circuits
keyword: conference-papers
keyword: fault-model
keyword: infoeu-reposemanticsconferenceobject
keyword: pacs-8542
keyword: quasi-delay-insensitive
keyword: simulation
keyword: spinanoengineering-sciences-physicsmicro-and-nanotechnologiesmicroelectronics
keyword: transient-fault
issued: 2026-05-13T11:51:09.614765
modified: 2026-05-13T11:51:09.614778
language: en
contact point: Organization
  fn: CCSD

test_moissonnage_selune
type: Agent

Asynchronous circuits transient faults sensitivity evaluation
type: Distribution
format: HTML
access URL: https://hal.science/hal-00079753
issued: 2026-05-13T11:51:09.674083
modified: 2026-05-13T11:51:09.582125