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Methodology for test metrics estimation built-in design flow of hard-to-simul...
The pervasiveness of the semiconductor industry in an increasing range of applications that span human activity stems from our ability to integrate more and more... -
Multivariate Statistical Techniques for Analog Parametric Test Metrics Estima...
ISBN 978-1-4673-6038-8 -
Statistical Modelling of Analog Circuits for Test Metrics Computation
ISBN 978-1-4673-6038-8
