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Microstructural heterogeneities and fatigue anisotropy
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Numerical study of electro-thermal effects in silicon devices
The ultra-short gate (LG < 20 nm) CMOS components (Complementary Metal-Oxide-Semiconductor) face thermal limitations due to significant local heating induced by... -
Very high cycle fatigue for single phase ductile materials: microplasticity a...
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A finite strain thermo-viscoelastic constitutive model to describe the self-h...
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Fast fatigue properties identification by "self-heating" method : application...
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Correlation between self-ignition of a dust layer on a hot surface and in bas...
International audience -
Measurement and numerical simulation of the self heating of cross-linked segm...
International audience
