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Optimization of the work function measurement by local probe microscopy under...
The development of nanoscience makes the understanding of the electrical properties of nano-objects essential. The Kelvin Force Microscopy (KFM) is one of the most... -
Study of individual doped semiconductor wires by local techniques of surface ...
This thesis addresses the characterization of individual doped semiconductors microand nanowires by photoemission electron microscopy (XPEEM) and near field techniques...
