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Monitoring the growth and reactivity of metal nanoclusters by in situ optical...
A non-intrusive in situ surface differential reflectance spectroscopy (SDRS) is adapted on a magnetron sputtering deposition technique in order to study the optical... -
3D nanoimaging of semiconductor devices and materials by electron tomography
In this thesis electron tomography is developed and applied as a tool for three-dimensional nanoscale characterization of semiconductor materials and devices. The...
