Dataset - CKAN

Failure Mechanisms of Discrete Protection Device subjected to Repetitive Elec...

International audience
- HTML
On-chip measurement to analyze failure mechanisms of ICs under system level E...

International audience
- HTML
A System-Level Electrostatic-Discharge-Protection Modeling Methodology for Ti...

International audience
- HTML
Combined MOS-IGBT-SCR structure for a compact high-robustness ESD power clamp...

International audience
- HTML

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