Dataset - CKAN

Mechanical stress and resistivity analysis of the integrated circuits copper ...

The evolution of the microelectronic technology leads to a transistors integration density always stronger. The Damascene copper interconnections structures follow...
- HTML
Microstructural Investigation of Co-rolled Nanocrystalline Stainless Steel Sh...

International audience
- HTML
Mechanisms of deformation in gum metal TNTZ-O and TNTZ titanium alloys: A com...

International audience
- HTML

You can also access this registry using the API (see API Docs).